diff --git a/pcbnew/drc/drc_test_provider_silk_to_mask.cpp b/pcbnew/drc/drc_test_provider_silk_to_mask.cpp
index 722883ba42..d0c5bdcc52 100644
--- a/pcbnew/drc/drc_test_provider_silk_to_mask.cpp
+++ b/pcbnew/drc/drc_test_provider_silk_to_mask.cpp
@@ -166,8 +166,8 @@ bool DRC_TEST_PROVIDER_SILK_TO_MASK::Run()
                 return true;
             };
 
-    int numMask = forEachGeometryItem( {}, LSET( 2, F_Mask, B_Mask ), addMaskToTree );
-    int numSilk = forEachGeometryItem( {}, LSET( 2, F_SilkS, B_SilkS ), addSilkToTree );
+    int numMask = forEachGeometryItem( s_allBasicItems, LSET( 2, F_Mask, B_Mask ), addMaskToTree );
+    int numSilk = forEachGeometryItem( s_allBasicItems, LSET( 2, F_SilkS, B_SilkS ), addSilkToTree );
 
     reportAux( _("Testing %d mask apertures against %d silkscreen features."), numMask, numSilk );