From 45113f983bb2f1a67d31cf918ce8ed4cca1c62b6 Mon Sep 17 00:00:00 2001 From: Jeff Young Date: Sun, 25 Oct 2020 23:18:52 +0000 Subject: [PATCH] Fix test case. Silk tests were processing MODULE_Ts when they shouldn't have been. --- pcbnew/drc/drc_test_provider_silk_to_mask.cpp | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) diff --git a/pcbnew/drc/drc_test_provider_silk_to_mask.cpp b/pcbnew/drc/drc_test_provider_silk_to_mask.cpp index 722883ba42..d0c5bdcc52 100644 --- a/pcbnew/drc/drc_test_provider_silk_to_mask.cpp +++ b/pcbnew/drc/drc_test_provider_silk_to_mask.cpp @@ -166,8 +166,8 @@ bool DRC_TEST_PROVIDER_SILK_TO_MASK::Run() return true; }; - int numMask = forEachGeometryItem( {}, LSET( 2, F_Mask, B_Mask ), addMaskToTree ); - int numSilk = forEachGeometryItem( {}, LSET( 2, F_SilkS, B_SilkS ), addSilkToTree ); + int numMask = forEachGeometryItem( s_allBasicItems, LSET( 2, F_Mask, B_Mask ), addMaskToTree ); + int numSilk = forEachGeometryItem( s_allBasicItems, LSET( 2, F_SilkS, B_SilkS ), addSilkToTree ); reportAux( _("Testing %d mask apertures against %d silkscreen features."), numMask, numSilk );