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kicad/pcb_calculator/transline/microstrip.cpp

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/*
* microstrip.cpp - microstrip class implementation
*
* Copyright (C) 2001 Gopal Narayanan <gopal@astro.umass.edu>
* Copyright (C) 2002 Claudio Girardi <claudio.girardi@ieee.org>
* Copyright (C) 2005, 2006 Stefan Jahn <stefan@lkcc.org>
* Modified for Kicad: 2018 Jean-Pierre Charras <jp.charras at wanadoo.fr>
* Copyright (C) 1992-2023 Kicad Developers, see AUTHORS.txt for contributors.
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License as published by
* the Free Software Foundation; either version 2 of the License, or (at
* your option) any later version.
*
* This program is distributed in the hope that it will be useful, but
* WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
* General Public License for more details.
*
* You should have received a copy of the GNU General Public License
* along with this package; see the file COPYING. If not, write to
* the Free Software Foundation, Inc., 51 Franklin Street - Fifth Floor,
* Boston, MA 02110-1301, USA.
*
*/
/* microstrip.c - Puts up window for microstrip and
* performs the associated calculations
* Based on the original microstrip.c by Gopal Narayanan
*/
#include <cmath>
#include <cstdio>
#include <cstdlib>
#include <cstring>
#include "microstrip.h"
#include "transline.h"
#include "units.h"
MICROSTRIP::MICROSTRIP() : TRANSLINE(),
h( 0.0 ), // height of substrate
ht( 0.0 ), // height to the top of box
t( 0.0 ), // thickness of top metal
rough( 0.0 ), // Roughness of top metal
mur( 0.0 ), // magnetic permeability of substrate
w( 0.0 ), // width of line
l( 0.0 ), // length of line
Z0_0( 0.0 ), // static characteristic impedance
Z0( 0.0 ), // characteristic impedance
er_eff_0( 0.0 ), // Static effective dielectric constant
mur_eff( 0.0 ), // Effective mag. permeability
w_eff( 0.0 ), // Effective width of line
atten_dielectric( 0.0 ), // Loss in dielectric (dB)
atten_cond( 0.0 ), // Loss in conductors (dB)
Z0_h_1( 0.0 ) // homogeneous stripline impedance
{
m_Name = "MicroStrip";
Init();
}
/*
* Z0_homogeneous() - compute the impedance for a stripline in a
* homogeneous medium, without cover effects
*/
double MICROSTRIP::Z0_homogeneous( double u )
{
double freq, Z0_value;
freq = 6.0 + ( 2.0 * M_PI - 6.0 ) * exp( -pow( 30.666 / u, 0.7528 ) );
Z0_value = ( ZF0 / ( 2.0 * M_PI ) ) * log( freq / u + sqrt( 1.0 + 4.0 / ( u * u ) ) );
return Z0_value;
}
/*
* delta_Z0_cover() - compute the cover effect on impedance for a
* stripline in a homogeneous medium
*/
double MICROSTRIP::delta_Z0_cover( double u, double h2h )
{
double P, Q;
double h2hp1;
h2hp1 = 1.0 + h2h;
P = 270.0 * ( 1.0 - tanh( 1.192 + 0.706 * sqrt( h2hp1 ) - 1.389 / h2hp1 ) );
Q = 1.0109 - atanh( ( 0.012 * u + 0.177 * u * u - 0.027 * u * u * u ) / ( h2hp1 * h2hp1 ) );
return P * Q;
}
/*
* filling_factor() - compute the filling factor for a microstrip
* without cover and zero conductor thickness
*/
double MICROSTRIP::filling_factor( double u, double e_r )
{
double a, b, q_inf;
double u2, u3, u4;
u2 = u * u;
u3 = u2 * u;
u4 = u3 * u;
a = 1.0 + log( ( u4 + u2 / 2704 ) / ( u4 + 0.432 ) ) / 49.0 + log( 1.0 + u3 / 5929.741 ) / 18.7;
b = 0.564 * pow( ( e_r - 0.9 ) / ( e_r + 3.0 ), 0.053 );
q_inf = pow( 1.0 + 10.0 / u, -a * b );
return q_inf;
}
/*
* delta_q_cover() - compute the cover effect on filling factor
*/
double MICROSTRIP::delta_q_cover( double h2h )
{
double q_c;
q_c = tanh( 1.043 + 0.121 * h2h - 1.164 / h2h );
return q_c;
}
/*
* delta_q_thickness() - compute the thickness effect on filling factor
*/
double MICROSTRIP::delta_q_thickness( double u, double t_h )
{
double q_t;
q_t = ( 2.0 * log( 2.0 ) / M_PI ) * ( t_h / sqrt( u ) );
return q_t;
}
/*
* e_r_effective() - compute effective dielectric constant from
* material e_r and filling factor
*/
double MICROSTRIP::e_r_effective( double e_r, double q )
{
double e_r_eff;
e_r_eff = 0.5 * ( e_r + 1.0 ) + 0.5 * q * ( e_r - 1.0 );
return e_r_eff;
}
/*
* delta_u_thickness - compute the thickness effect on normalized width
*/
double MICROSTRIP::delta_u_thickness( double u, double t_h, double e_r )
{
double delta_u;
if( t_h > 0.0 )
{
/* correction for thickness for a homogeneous microstrip */
delta_u = ( t_h / M_PI )
* log( 1.0 + ( 4.0 * M_E ) * pow( tanh( sqrt( 6.517 * u ) ), 2.0 ) / t_h );
/* correction for strip on a substrate with relative permettivity e_r */
delta_u = 0.5 * delta_u * ( 1.0 + 1.0 / cosh( sqrt( e_r - 1.0 ) ) );
}
else
{
delta_u = 0.0;
}
return delta_u;
}
/*
* microstrip_Z0() - compute microstrip static impedance
*/
void MICROSTRIP::microstrip_Z0()
{
double e_r, h2, h2h, u, t_h;
double Z0_h_r;
double delta_u_1, delta_u_r, q_inf, q_c, q_t, e_r_eff, e_r_eff_t, q;
e_r = m_parameters[EPSILONR_PRM];
h2 = m_parameters[H_T_PRM];
h2h = h2 / m_parameters[H_PRM];
u = m_parameters[PHYS_WIDTH_PRM] / m_parameters[H_PRM];
t_h = m_parameters[T_PRM] / m_parameters[H_PRM];
/* compute normalized width correction for e_r = 1.0 */
delta_u_1 = delta_u_thickness( u, t_h, 1.0 );
/* compute homogeneous stripline impedance */
Z0_h_1 = Z0_homogeneous( u + delta_u_1 );
/* compute normalized width correction */
delta_u_r = delta_u_thickness( u, t_h, e_r );
u += delta_u_r;
/* compute homogeneous stripline impedance */
Z0_h_r = Z0_homogeneous( u );
/* filling factor, with width corrected for thickness */
q_inf = filling_factor( u, e_r );
/* cover effect */
q_c = delta_q_cover( h2h );
/* thickness effect */
q_t = delta_q_thickness( u, t_h );
/* resultant filling factor */
q = ( q_inf - q_t ) * q_c;
/* e_r corrected for thickness and non homogeneous material */
e_r_eff_t = e_r_effective( e_r, q );
/* effective dielectric constant */
e_r_eff = e_r_eff_t * pow( Z0_h_1 / Z0_h_r, 2.0 );
/* characteristic impedance, corrected for thickness, cover */
/* and non homogeneous material */
m_parameters[Z0_PRM] = Z0_h_r / sqrt( e_r_eff_t );
w_eff = u * m_parameters[H_PRM];
er_eff_0 = e_r_eff;
Z0_0 = m_parameters[Z0_PRM];
}
/*
* e_r_dispersion() - computes the dispersion correction factor for
* the effective permeability
*/
double MICROSTRIP::e_r_dispersion( double u, double e_r, double f_n )
{
double P_1, P_2, P_3, P_4, P;
P_1 = 0.27488 + u * ( 0.6315 + 0.525 / pow( 1.0 + 0.0157 * f_n, 20.0 ) )
- 0.065683 * exp( -8.7513 * u );
P_2 = 0.33622 * ( 1.0 - exp( -0.03442 * e_r ) );
P_3 = 0.0363 * exp( -4.6 * u ) * ( 1.0 - exp( -pow( f_n / 38.7, 4.97 ) ) );
P_4 = 1.0 + 2.751 * ( 1.0 - exp( -pow( e_r / 15.916, 8.0 ) ) );
P = P_1 * P_2 * pow( ( P_3 * P_4 + 0.1844 ) * f_n, 1.5763 );
return P;
}
/*
* Z0_dispersion() - computes the dispersion correction factor for the
* characteristic impedance
*/
double MICROSTRIP::Z0_dispersion(
double u, double e_r, double e_r_eff_0, double e_r_eff_f, double f_n )
{
double R_1, R_2, R_3, R_4, R_5, R_6, R_7, R_8, R_9, R_10, R_11, R_12, R_13, R_14, R_15, R_16,
R_17, D, tmpf;
R_1 = 0.03891 * pow( e_r, 1.4 );
R_2 = 0.267 * pow( u, 7.0 );
R_3 = 4.766 * exp( -3.228 * pow( u, 0.641 ) );
R_4 = 0.016 + pow( 0.0514 * e_r, 4.524 );
R_5 = pow( f_n / 28.843, 12.0 );
R_6 = 22.2 * pow( u, 1.92 );
R_7 = 1.206 - 0.3144 * exp( -R_1 ) * ( 1.0 - exp( -R_2 ) );
R_8 = 1.0
+ 1.275
* ( 1.0
- exp( -0.004625 * R_3 * pow( e_r, 1.674 )
* pow( f_n / 18.365, 2.745 ) ) );
tmpf = pow( e_r - 1.0, 6.0 );
R_9 = 5.086 * R_4 * ( R_5 / ( 0.3838 + 0.386 * R_4 ) )
* ( exp( -R_6 ) / ( 1.0 + 1.2992 * R_5 ) ) * ( tmpf / ( 1.0 + 10.0 * tmpf ) );
R_10 = 0.00044 * pow( e_r, 2.136 ) + 0.0184;
tmpf = pow( f_n / 19.47, 6.0 );
R_11 = tmpf / ( 1.0 + 0.0962 * tmpf );
R_12 = 1.0 / ( 1.0 + 0.00245 * u * u );
R_13 = 0.9408 * pow( e_r_eff_f, R_8 ) - 0.9603;
R_14 = ( 0.9408 - R_9 ) * pow( e_r_eff_0, R_8 ) - 0.9603;
R_15 = 0.707 * R_10 * pow( f_n / 12.3, 1.097 );
R_16 = 1.0 + 0.0503 * e_r * e_r * R_11 * ( 1.0 - exp( -pow( u / 15.0, 6.0 ) ) );
R_17 = R_7 * ( 1.0 - 1.1241 * ( R_12 / R_16 ) * exp( -0.026 * pow( f_n, 1.15656 ) - R_15 ) );
D = pow( R_13 / R_14, R_17 );
return D;
}
/*
* dispersion() - compute frequency dependent parameters of
* microstrip
*/
void MICROSTRIP::dispersion()
{
double e_r, e_r_eff_0;
double u, f_n, P, e_r_eff_f, D, Z0_f;
e_r = m_parameters[EPSILONR_PRM];
e_r_eff_0 = er_eff_0;
u = m_parameters[PHYS_WIDTH_PRM] / m_parameters[H_PRM];
/* normalized frequency [GHz * mm] */
f_n = m_parameters[FREQUENCY_PRM] * m_parameters[H_PRM] / 1e06;
P = e_r_dispersion( u, e_r, f_n );
/* effective dielectric constant corrected for dispersion */
e_r_eff_f = e_r - ( e_r - e_r_eff_0 ) / ( 1.0 + P );
D = Z0_dispersion( u, e_r, e_r_eff_0, e_r_eff_f, f_n );
Z0_f = Z0_0 * D;
m_parameters[EPSILON_EFF_PRM] = e_r_eff_f;
m_parameters[Z0_PRM] = Z0_f;
}
/*
* conductor_losses() - compute microstrip conductor losses per unit
* length
*/
double MICROSTRIP::conductor_losses()
{
double e_r_eff_0, delta;
double K, R_s, Q_c, alpha_c;
e_r_eff_0 = er_eff_0;
delta = m_parameters[SKIN_DEPTH_PRM];
if( m_parameters[FREQUENCY_PRM] > 0.0 )
{
/* current distribution factor */
K = exp( -1.2 * pow( Z0_h_1 / ZF0, 0.7 ) );
/* skin resistance */
R_s = 1.0 / ( m_parameters[SIGMA_PRM] * delta );
/* correction for surface roughness */
R_s *= 1.0
+ ( ( 2.0 / M_PI )
* atan( 1.40 * pow( ( m_parameters[ROUGH_PRM] / delta ), 2.0 ) ) );
/* strip inductive quality factor */
Q_c = ( M_PI * Z0_h_1 * m_parameters[PHYS_WIDTH_PRM] * m_parameters[FREQUENCY_PRM] )
/ ( R_s * C0 * K );
alpha_c = ( 20.0 * M_PI / log( 10.0 ) ) * m_parameters[FREQUENCY_PRM] * sqrt( e_r_eff_0 )
/ ( C0 * Q_c );
}
else
{
alpha_c = 0.0;
}
return alpha_c;
}
/*
* dielectric_losses() - compute microstrip dielectric losses per unit
* length
*/
double MICROSTRIP::dielectric_losses()
{
double e_r, e_r_eff_0;
double alpha_d;
e_r = m_parameters[EPSILONR_PRM];
e_r_eff_0 = er_eff_0;
alpha_d = ( 20.0 * M_PI / log( 10.0 ) ) * ( m_parameters[FREQUENCY_PRM] / C0 )
* ( e_r / sqrt( e_r_eff_0 ) ) * ( ( e_r_eff_0 - 1.0 ) / ( e_r - 1.0 ) )
* m_parameters[TAND_PRM];
return alpha_d;
}
/*
* attenuation() - compute attenuation of microstrip
*/
void MICROSTRIP::attenuation()
{
m_parameters[SKIN_DEPTH_PRM] = skin_depth();
atten_cond = conductor_losses() * m_parameters[PHYS_LEN_PRM];
atten_dielectric = dielectric_losses() * m_parameters[PHYS_LEN_PRM];
}
/*
* mur_eff_ms() - returns effective magnetic permeability
*/
void MICROSTRIP::mur_eff_ms()
{
double* mur = &m_parameters[MUR_PRM];
double* h = &m_parameters[H_PRM];
double* w = &m_parameters[PHYS_WIDTH_PRM];
mur_eff = ( 2.0 * *mur )
/ ( ( 1.0 + *mur ) + ( ( 1.0 - *mur ) * pow( ( 1.0 + ( 10.0 * *h / *w ) ), -0.5 ) ) );
}
// synth_width - calculate width given Z0 and e_r
double MICROSTRIP::synth_width()
{
double e_r, a, b;
double w_h, width;
e_r = m_parameters[EPSILONR_PRM];
a = ( ( m_parameters[Z0_PRM] / ZF0 / 2 / M_PI ) * sqrt( ( e_r + 1 ) / 2. ) )
+ ( ( e_r - 1 ) / ( e_r + 1 ) * ( 0.23 + ( 0.11 / e_r ) ) );
b = ZF0 / 2 * M_PI / ( m_parameters[Z0_PRM] * sqrt( e_r ) );
if( a > 1.52 )
{
w_h = 8 * exp( a ) / ( exp( 2. * a ) - 2 );
}
else
{
w_h = ( 2. / M_PI )
* ( b - 1. - log( ( 2 * b ) - 1. )
+ ( ( e_r - 1 ) / ( 2 * e_r ) ) * ( log( b - 1. ) + 0.39 - 0.61 / e_r ) );
}
if( m_parameters[H_PRM] > 0.0 )
width = w_h * m_parameters[H_PRM];
else
width = 0;
return width;
}
/*
* line_angle() - calculate microstrip length in radians
*/
void MICROSTRIP::line_angle()
{
double e_r_eff;
double v, lambda_g;
e_r_eff = m_parameters[EPSILON_EFF_PRM];
/* velocity */
v = C0 / sqrt( e_r_eff * mur_eff );
/* wavelength */
lambda_g = v / m_parameters[FREQUENCY_PRM];
/* electrical angles */
m_parameters[ANG_L_PRM] = 2.0 * M_PI * m_parameters[PHYS_LEN_PRM] / lambda_g; /* in radians */
}
void MICROSTRIP::calcAnalyze()
{
/* effective permeability */
mur_eff_ms();
/* static impedance */
microstrip_Z0();
/* calculate freq dependence of er and Z0 */
dispersion();
/* calculate electrical lengths */
line_angle();
/* calculate losses */
attenuation();
}
void MICROSTRIP::show_results()
{
setProperty( Z0_PRM, m_parameters[Z0_PRM] );
setProperty( ANG_L_PRM, m_parameters[ANG_L_PRM] );
setResult( 0, m_parameters[EPSILON_EFF_PRM], "" );
setResult( 1, atten_cond, "dB" );
setResult( 2, atten_dielectric, "dB" );
setResult( 3, m_parameters[SKIN_DEPTH_PRM] / UNIT_MICRON, "µm" );
}
void MICROSTRIP::showSynthesize()
{
setProperty( PHYS_WIDTH_PRM, m_parameters[PHYS_WIDTH_PRM] );
setProperty( PHYS_LEN_PRM, m_parameters[PHYS_LEN_PRM] );
// Check for errors
if( !std::isfinite( m_parameters[PHYS_LEN_PRM] ) || ( m_parameters[PHYS_LEN_PRM] < 0 ) )
setErrorLevel( PHYS_LEN_PRM, TRANSLINE_ERROR );
if( !std::isfinite( m_parameters[PHYS_WIDTH_PRM] ) || ( m_parameters[PHYS_WIDTH_PRM] <= 0 ) )
setErrorLevel( PHYS_WIDTH_PRM, TRANSLINE_ERROR );
// Check for warnings
if( !std::isfinite( m_parameters[Z0_PRM] ) || ( m_parameters[Z0_PRM] < 0 ) )
setErrorLevel( Z0_PRM, TRANSLINE_WARNING );
if( !std::isfinite( m_parameters[ANG_L_PRM] ) || ( m_parameters[ANG_L_PRM] < 0 ) )
setErrorLevel( ANG_L_PRM, TRANSLINE_WARNING );
}
void MICROSTRIP::showAnalyze()
{
setProperty( Z0_PRM, m_parameters[Z0_PRM] );
setProperty( ANG_L_PRM, m_parameters[ANG_L_PRM] );
// Check for errors
if( !std::isfinite( m_parameters[Z0_PRM] ) || ( m_parameters[Z0_PRM] < 0 ) )
setErrorLevel( Z0_PRM, TRANSLINE_ERROR );
if( !std::isfinite( m_parameters[ANG_L_PRM] ) || ( m_parameters[ANG_L_PRM] < 0 ) )
setErrorLevel( ANG_L_PRM, TRANSLINE_ERROR );
// Check for warnings
if( !std::isfinite( m_parameters[PHYS_LEN_PRM] ) || ( m_parameters[PHYS_LEN_PRM] < 0 ) )
setErrorLevel( PHYS_LEN_PRM, TRANSLINE_WARNING );
if( !std::isfinite( m_parameters[PHYS_WIDTH_PRM] ) || ( m_parameters[PHYS_WIDTH_PRM] <= 0 ) )
setErrorLevel( PHYS_WIDTH_PRM, TRANSLINE_WARNING );
}
/*
* synthesis function
*/
void MICROSTRIP::calcSynthesize()
{
double z0_dest = m_parameters[Z0_PRM];
double angl_dest = m_parameters[ANG_L_PRM];
/* calculate width and use for initial value in Newton's method */
m_parameters[PHYS_WIDTH_PRM] = synth_width();
minimizeZ0Error1D( &( m_parameters[PHYS_WIDTH_PRM] ) );
m_parameters[Z0_PRM] = z0_dest;
m_parameters[ANG_L_PRM] = angl_dest;
double const er_eff = m_parameters[EPSILON_EFF_PRM];
m_parameters[PHYS_LEN_PRM] = C0 / m_parameters[FREQUENCY_PRM] / sqrt( er_eff * mur_eff )
* m_parameters[ANG_L_PRM] / 2.0 / M_PI; /* in m */
calcAnalyze();
m_parameters[Z0_PRM] = z0_dest;
m_parameters[ANG_L_PRM] = angl_dest;
m_parameters[PHYS_LEN_PRM] = C0 / m_parameters[FREQUENCY_PRM] / sqrt( er_eff * mur_eff )
* m_parameters[ANG_L_PRM] / 2.0 / M_PI; /* in m */
}
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