tests: extend endianess conversion tests to also cover the 48bit writer
Cover the recently added writer for 48bit little endian data. Prepare a large bytes pattern buffer that can also serve for future 64bit tests.
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20
tests/conv.c
20
tests/conv.c
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@ -34,6 +34,16 @@ static const uint8_t buff8125fb[] = {
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static const uint8_t buff8125fl[] = {
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static const uint8_t buff8125fl[] = {
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0x00, 0x00, 0x02, 0x41, 0x00, 0x00, 0x00, 0x00,
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0x00, 0x00, 0x02, 0x41, 0x00, 0x00, 0x00, 0x00,
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};
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};
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static const uint8_t buff1234large[] = {
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0x01, 0x02, 0x03, 0x04, 0x05, 0x06, 0x07, 0x08,
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0x09, 0x0a, 0x0b, 0x0c, 0x0d, 0x0e, 0x0f, 0x10,
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0x11, 0x12, 0x13, 0x14, 0x15, 0x16, 0x17, 0x18,
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0x19, 0x1a, 0x1b, 0x1c, 0x1d, 0x1e, 0x1f, 0x20,
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0x21, 0x22, 0x23, 0x24, 0x25, 0x26, 0x27, 0x28,
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0x29, 0x2a, 0x2b, 0x2c, 0x2d, 0x2e, 0x2f, 0x30,
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0x31, 0x32, 0x33, 0x34, 0x35, 0x36, 0x37, 0x38,
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0x39, 0x3a, 0x3b, 0x3c, 0x3d, 0x3e, 0x3f, 0x40,
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};
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START_TEST(test_endian_macro)
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START_TEST(test_endian_macro)
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{
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{
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@ -201,6 +211,7 @@ START_TEST(test_endian_write_inc)
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size_t l;
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size_t l;
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memset(buff, 0, sizeof(buff));
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memset(buff, 0, sizeof(buff));
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p = &buff[0];
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p = &buff[0];
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write_u8_inc(&p, 0x11);
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write_u8_inc(&p, 0x11);
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write_u16be_inc(&p, 0x2233);
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write_u16be_inc(&p, 0x2233);
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@ -208,6 +219,15 @@ START_TEST(test_endian_write_inc)
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l = p - &buff[0];
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l = p - &buff[0];
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fail_unless(l == sizeof(uint8_t) + sizeof(uint16_t) + sizeof(uint32_t));
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fail_unless(l == sizeof(uint8_t) + sizeof(uint16_t) + sizeof(uint32_t));
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fail_unless(memcmp(&buff[0], &buff1234[0], l) == 0);
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fail_unless(memcmp(&buff[0], &buff1234[0], l) == 0);
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p = &buff[0];
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write_u48le_inc(&p, 0x060504030201);
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write_u48le_inc(&p, 0x0c0b0a090807);
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write_u48le_inc(&p, 0x1211100f0e0d);
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write_u48le_inc(&p, 0x181716151413);
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l = p - &buff[0];
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fail_unless(l == 4 * 48 / 8 * sizeof(uint8_t));
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fail_unless(memcmp(&buff[0], &buff1234large[0], l) == 0);
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}
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}
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END_TEST
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END_TEST
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