Also, consistently use 'ch' for channel variables. This matches how we
consistently use sdi, devc, and so on all over the code-base.
This fixes parts of bug #259.
The name 'probe' (and thus 'probe group') is a relic from the times when
sigrok was mostly about logic analyzers. Nowadays we support a lot more
device types where 'probe' is not really a good term and 'channel' is
much better suited.
This fixes parts of bug #259.
Instead of >= 44 Makefile.am's we now only have one top-level
Makefile.am, and use the 'subdir-objects' automake option to
handle the build via non-recursive (auto)make.
This has the advantage of fewer (boilerplate or other) files and less
clutter in general, as well as performance advantages since the new
setup can build many files in parallel (with 'make -j'), not only 2 or 3
files within the same (e.g. hardware/xxxx/* subdirectory) and also since
we no longer need to build intermediate libtool helper libs per subdirectory.
A quick, non-scientific test build on a quad-core laptop with 'make -j 4'
yields a build time reduction from 35s to 19s.
All autotools features that worked before are still intact without any
regressions, including the Make targets 'install', 'uninstall', 'check',
'dist', 'clean', 'distclean' and so on, as well as all the usual portability
handling (build works on any OS, with any Make implementation such as
GNU Make or BSD Make, with any shell such as sh/ksh/zsh/bash/dash, etc. etc.)
and features such as out-of-tree build support, cross-compile support,
testsuite support (also with colored output), "silent make rules", etc. etc.
The maximum sample size that can be set on a device is now published
by sr_config_list(SR_CONF_LIMIT_SAMPLES). This returns a tuple of
uint64_t representing minimum and maximum number of samples.
SR_CONF_PATTERN_MODE was not handled in config_list(), yielding
non-working OLS support in PulseView (due to an assert), and a missing
pattern list in sigrok-cli's --show output.
This fixes bug #184.
The scan() function was opening the port in non-blocking mode, the dev_open()
function however was not using the SERIAL_NONBLOCK flag. This led to hangs
in certain situations.
This fixes the OLS e.g. on NetBSD.
For demux mode we half the channels. Previous check method broke
the OLS randomly and but it in a bad state.
Signed-off-by: Matt Ranostay <mranostay@gmail.com>
demux mode allows DDR sampling which disables group 2 & 3
and thus samples group 0 & 1 to sample on rising and falling of
the clock.
Signed-off-by: Matt Ranostay <mranostay@gmail.com>
Allow channel groups to be swapped. This is useful
for demux at 200mhz with the unbuffered channels.
Signed-off-by: Matt Ranostay <mranostay@gmail.com>
The high bit of the sample, denoting this is a count, was not getting
properly cleared. This resulted in an inevitably negative count, and
corruption of the sample buffer before it was transferred to the
frontend.
The single sample buffer, up to 4 bytes long, was not getting initialized
on (every) acquisition start, only after the first full sample was in.
This caused the first sample to potentially hold garbage.
ols allows both external and internal test patterns at ~20khz
which are helpful for unit tests and demos.
pattern=internal -> route pattern internally to all 32 pins
(input otherwise disabled)
pattern=external -> generates pattern on unbuffered pins 16:31
(which can be looped back to the buffered pins 0:15)
Signed-off-by: Matt Ranostay <mranostay@gmail.com>
Stage count was always getting incremented one more than
actual stages, and this caused a extra stage with zero'ed data
probe lines to have the start bit field.
Signed-off-by: Matt Ranostay <mranostay@gmail.com>
The per-driver API calls no longer have a hw_ prefix (e.g. hw_init()
became init() and so on), so drop the 'hw_' from the std versions
for those API callbacks too.
This off-by-one was clobbering the stack since introduced in a803c0db4d.
However it only set one bit, and that generally appears to have been set
already, so this rarely affected anything. But when it did, it affected
a pointer, causing a segfault.